Scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment

In this thesis, the performance of various scheduling heuristics of a single serial processing machine with multiple job types in the semiconductor assembly test environment is analyzed. Two types of heuristics are developed in this research. The heuristic with next arrival information is compared w...

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Main Author: Jiang, Nan
Other Authors: Appa Iyer Sivakumar
Format: Theses and Dissertations
Language:English
Published: 2014
Subjects:
Online Access:http://hdl.handle.net/10356/60644
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-606442020-11-01T11:39:13Z Scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment Jiang, Nan Appa Iyer Sivakumar School of Mechanical and Aerospace Engineering Singapore-MIT Alliance Programme DRNTU::Engineering::Manufacturing In this thesis, the performance of various scheduling heuristics of a single serial processing machine with multiple job types in the semiconductor assembly test environment is analyzed. Two types of heuristics are developed in this research. The heuristic with next arrival information is compared with the heuristic without future information to study how the performance is influenced by forecast. Considering the dynamic manufacturing characteristics of the semiconductor industry, the impact of different level of forecast error is analyzed under different traffic intensities. Two sets of heuristics are tested in simulations to demonstrate that the performance of a model with future information highly depends on how the forecast information is utilized in the heuristics. ​Master of Science (IMST) 2014-05-29T03:34:40Z 2014-05-29T03:34:40Z 2010 2010 Thesis http://hdl.handle.net/10356/60644 en 79 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Manufacturing
spellingShingle DRNTU::Engineering::Manufacturing
Jiang, Nan
Scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment
description In this thesis, the performance of various scheduling heuristics of a single serial processing machine with multiple job types in the semiconductor assembly test environment is analyzed. Two types of heuristics are developed in this research. The heuristic with next arrival information is compared with the heuristic without future information to study how the performance is influenced by forecast. Considering the dynamic manufacturing characteristics of the semiconductor industry, the impact of different level of forecast error is analyzed under different traffic intensities. Two sets of heuristics are tested in simulations to demonstrate that the performance of a model with future information highly depends on how the forecast information is utilized in the heuristics.
author2 Appa Iyer Sivakumar
author_facet Appa Iyer Sivakumar
Jiang, Nan
format Theses and Dissertations
author Jiang, Nan
author_sort Jiang, Nan
title Scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment
title_short Scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment
title_full Scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment
title_fullStr Scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment
title_full_unstemmed Scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment
title_sort scheduling strategies of a single serial processing machine with multiple job types in the semiconductor assembly test environment
publishDate 2014
url http://hdl.handle.net/10356/60644
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