Growth and characterization of III-V quantum dots on SI-based substrate

This thesis presents a systematic study of InAs quantum dot (QD) growth on Sibased substrates. Two Si-based platforms were studied, namely the graded Si1-xGex/Si substrate which has a high threading dislocation density (~106cm-2), and the germaniumon- insulator (GeOI) platform which has a lower thr...

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Bibliographic Details
Main Author: Leong, Yu Yan
Other Authors: Eugene A Fitzgerald
Format: Theses and Dissertations
Language:English
Published: 2014
Subjects:
Online Access:https://hdl.handle.net/10356/61068
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Institution: Nanyang Technological University
Language: English