Reference-free beam-sampling (RFBS) methodology and system for optical freeform surface measurements

• المؤلف الرئيسي: Guo, Wenjiang
• مؤلفون آخرون: Chen I-Ming
• التنسيق: Theses and Dissertations
• اللغة: English
• منشور في: 2015
• الموضوعات: DRNTU::Engineering::Manufacturing::Metrology
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/62336
• المؤسسة: Nanyang Technological University

Freeform surfaces of optical quality are of huge demand in the precision and optical industry. Although six degree-of-freedom manufacturing technologies are available to fabricate such surfaces, the metrology infrastructure cannot simultaneously perform accurate, universal and non-contact large area...