Ang, D. J. H., & Wong Kin Shun, T. (2015). Reduced temperature electrical measurement of semiconductor devices.
استشهاد بنمط شيكاغوAng, Derrick Jia Hao, و Terence Wong Kin Shun. Reduced Temperature Electrical Measurement of Semiconductor Devices. 2015.
MLA استشهادAng, Derrick Jia Hao, و Terence Wong Kin Shun. Reduced Temperature Electrical Measurement of Semiconductor Devices. 2015.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.