Reduced temperature electrical measurement of semiconductor devices

• المؤلف الرئيسي: Ang, Derrick Jia Hao
• مؤلفون آخرون: Wong Kin Shun, Terence
• التنسيق: Final Year Project
• اللغة: English
• منشور في: 2015
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: http://hdl.handle.net/10356/63816

This report introduce the research status of thermoelectric cooling on semiconductors such as diode and semiconductor wafer. Measurement of current-voltage characteristic of semiconductor diodes by applying thermoelectric cooling device to determine how temperature affects its quality and operation....