Reduced temperature electrical measurement of semiconductor devices
This report introduce the research status of thermoelectric cooling on semiconductors such as diode and semiconductor wafer. Measurement of current-voltage characteristic of semiconductor diodes by applying thermoelectric cooling device to determine how temperature affects its quality and operation....
Saved in:
Main Author: | |
---|---|
Other Authors: | |
Format: | Final Year Project |
Language: | English |
Published: |
2015
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/63816 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
Be the first to leave a comment!