Fabrication and characterization of monolayer and few-layer 2D materials

The isolation of 2D materials has attracted much interest in recent years. There are many isolation methods that have been created to study the properties of 2D material. Mechanical exfoliation method has proved to be a successful method to isolate bulk layered materials. In this project, the isolat...

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Main Author: Tan, Coon Siong
Other Authors: Wang Qijie
Format: Final Year Project
Language:English
Published: 2015
Subjects:
Online Access:http://hdl.handle.net/10356/63915
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-639152023-07-07T17:24:41Z Fabrication and characterization of monolayer and few-layer 2D materials Tan, Coon Siong Wang Qijie School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering The isolation of 2D materials has attracted much interest in recent years. There are many isolation methods that have been created to study the properties of 2D material. Mechanical exfoliation method has proved to be a successful method to isolate bulk layered materials. In this project, the isolation and characterization of black phosphorus down to few layers thin by using mechanical exfoliation method are presented. Several methods are presented to determine the thickness of few layers black phosphorus such as optical imaging, Raman spectroscopy and AFM. Moreover, field-effect transistor based on few layers black phosphorus was fabricated and characterization of the transistor has been done in this project as well. The FET was found to be like ambipolar transistor as it shows both p type and n type behaviors in the drain current. The high drain current makes black phosphorus has huge potential for application in digital electronics. In addition, it also shows a distinct signature of ohmic contact (metal-BP) due to the drain current varies linearly with small source-drain biases. Lastly, mobility characteristic has been studied followed by recommendations in future work. Bachelor of Engineering 2015-05-20T04:06:12Z 2015-05-20T04:06:12Z 2015 2015 Final Year Project (FYP) http://hdl.handle.net/10356/63915 en Nanyang Technological University 60 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Tan, Coon Siong
Fabrication and characterization of monolayer and few-layer 2D materials
description The isolation of 2D materials has attracted much interest in recent years. There are many isolation methods that have been created to study the properties of 2D material. Mechanical exfoliation method has proved to be a successful method to isolate bulk layered materials. In this project, the isolation and characterization of black phosphorus down to few layers thin by using mechanical exfoliation method are presented. Several methods are presented to determine the thickness of few layers black phosphorus such as optical imaging, Raman spectroscopy and AFM. Moreover, field-effect transistor based on few layers black phosphorus was fabricated and characterization of the transistor has been done in this project as well. The FET was found to be like ambipolar transistor as it shows both p type and n type behaviors in the drain current. The high drain current makes black phosphorus has huge potential for application in digital electronics. In addition, it also shows a distinct signature of ohmic contact (metal-BP) due to the drain current varies linearly with small source-drain biases. Lastly, mobility characteristic has been studied followed by recommendations in future work.
author2 Wang Qijie
author_facet Wang Qijie
Tan, Coon Siong
format Final Year Project
author Tan, Coon Siong
author_sort Tan, Coon Siong
title Fabrication and characterization of monolayer and few-layer 2D materials
title_short Fabrication and characterization of monolayer and few-layer 2D materials
title_full Fabrication and characterization of monolayer and few-layer 2D materials
title_fullStr Fabrication and characterization of monolayer and few-layer 2D materials
title_full_unstemmed Fabrication and characterization of monolayer and few-layer 2D materials
title_sort fabrication and characterization of monolayer and few-layer 2d materials
publishDate 2015
url http://hdl.handle.net/10356/63915
_version_ 1772828619966513152