Defect characterization of low temperature solution grown ZnO
Zinc oxide (ZnO) is a wide bandgap semiconducting oxide with many potential applications in optoelectronic devices such as light emitting diodes (LEDs) and field effect transistors (FETs). Controlling the conductivity of ZnO is a foremost concern in the optoelectronic industry. Understanding the nat...
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| 格式: | Theses and Dissertations |
| 語言: | English |
| 出版: |
2016
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| 主題: | |
| 在線閱讀: | https://hdl.handle.net/10356/66016 |
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| 機構: | Nanyang Technological University |
| 語言: | English |