Yield and test time management

• Main Author: Wang, Nan
• Other Authors: Jong Ching Chuen
• Format: Final Year Project
• Language: English
• Published: 2016
• Subjects: DRNTU::Engineering
• Online Access: http://hdl.handle.net/10356/67413
• Institution: Nanyang Technological University

As an Industry Sponsored Project (ISP), this Yield and Test Time Management(YTM) project is attached to the burn-in testing team of Infineon Technologies Asia Pacific Pte Ltd, Singapore. The project is part of the team’s work to develop new features to the existing YTM application and apply data analysis to improve the device yield. This Thesis presents how the yield management is improved by adding new features into the existing YTM application To facilitate the work of this project, a local database was installed on a local laptop using the application MySQL Workbench 6.3 CE. The application Visual Studio (VS) Express for Web is used to develop the new features. Based on the existing features, two new features are developed. One of the tasks is Key Performance Index (KPI), it enables a new way to analyze the yield and volume testing data. Another task is Wafer Map Plotting, it enables the stacked wafer map with yield and volume information. In the end, the two features are integrated into YTM application and data analysis is applied to analyze the yield performance.