Soft-error tolerant design for satellite-board computations

High energy particles in the outer space could flip the state of the latches of the electronic devices. The upset of the latches is called soft error since it would not cause permanent damage to the device. However, the soft error may cause faults in a processor and lead to malfunction of the comput...

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主要作者: Zhang, Lei
其他作者: Hsu Wen Jing
格式: Theses and Dissertations
語言:English
出版: 2016
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在線閱讀:https://hdl.handle.net/10356/69206
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機構: Nanyang Technological University
語言: English