Application of fast laser deprocessing techniques in the field of semiconductor manufacturing

With technology scaling of semiconductor devices and further growth of the integrated circuit (IC) design and function complexity, it is necessary to increase the number of transistors in IC chip, layer stack, and process steps. The last few metal layers of Back End Of Line (BEOL) are usually very t...

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書目詳細資料
主要作者: Zhao, Yuzhe
其他作者: Wang Qijie
格式: Final Year Project
語言:English
出版: 2016
主題:
在線閱讀:http://hdl.handle.net/10356/69302
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