All-optical ultrafast electron bunch compression
Ultrafast electron imaging (UEI) is a class of imaging techniques which utilizes electron bunches instead of laser pulses to probe the nature of light and matter with picometer spatial resolution and attosecond temporal resolution, making it ideal for studying the most rapid and minute of phenomena....
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Main Author: | Lim, Jeremy Zhen Jie |
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Other Authors: | Chong Yidong |
Format: | Final Year Project |
Language: | English |
Published: |
2018
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Subjects: | |
Online Access: | http://hdl.handle.net/10356/74134 |
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Institution: | Nanyang Technological University |
Language: | English |
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