All-optical ultrafast electron bunch compression

Ultrafast electron imaging (UEI) is a class of imaging techniques which utilizes electron bunches instead of laser pulses to probe the nature of light and matter with picometer spatial resolution and attosecond temporal resolution, making it ideal for studying the most rapid and minute of phenomena....

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主要作者: Lim, Jeremy Zhen Jie
其他作者: Chong Yidong
格式: Final Year Project
語言:English
出版: 2018
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在線閱讀:http://hdl.handle.net/10356/74134
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