All-optical ultrafast electron bunch compression
Ultrafast electron imaging (UEI) is a class of imaging techniques which utilizes electron bunches instead of laser pulses to probe the nature of light and matter with picometer spatial resolution and attosecond temporal resolution, making it ideal for studying the most rapid and minute of phenomena....
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主要作者: | Lim, Jeremy Zhen Jie |
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其他作者: | Chong Yidong |
格式: | Final Year Project |
語言: | English |
出版: |
2018
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在線閱讀: | http://hdl.handle.net/10356/74134 |
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