Computer vision for advanced electron microscopy analysis

• Main Author: Darmajaya, Devina
• Other Authors: Li Shuzhou
• Format: Final Year Project
• Language: English
• Published: 2019
• Subjects: DRNTU::Engineering::Materials
• Online Access: http://hdl.handle.net/10356/77390
• Institution: Nanyang Technological University

Transmission electron microscopy (TEM) is one of the most powerful techniques used to characterize materials. However, characterization of a set of heterogenous sample images still remains as a persistent challenge. This can be a painstaking process in which researches may spend a tremendous amount...