Deposition and characterization of Bismuth nanofilm by sputtering

Deposition and characterization of Bismuth nanofilm by sputtering

Bismuthene, a layer of bismuth atoms, is predicted to be layered semiconductor, while its bulk counterpart is metallic. In this project, fabrication of bismuth thin films under different conditions will be done using the new sputtering system in NTU Nanoelectronics Lab 1 (NEL1) and characterization...

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Main Author: Seah, Jeric Tze Jie
Other Authors: Tay Beng Kang
Format: Final Year Project
Language:English
Published: 2019
Subjects:
DRNTU::Engineering::Electrical and electronic engineering
Online Access:http://hdl.handle.net/10356/77842
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Institution: Nanyang Technological University
Language: English
id sg-ntu-dr.10356-77842
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spelling sg-ntu-dr.10356-778422023-07-07T15:56:29Z Deposition and characterization of Bismuth nanofilm by sputtering Seah, Jeric Tze Jie Tay Beng Kang School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering Bismuthene, a layer of bismuth atoms, is predicted to be layered semiconductor, while its bulk counterpart is metallic. In this project, fabrication of bismuth thin films under different conditions will be done using the new sputtering system in NTU Nanoelectronics Lab 1 (NEL1) and characterization of the nanofilms will also be done using techniques such as Raman spectroscopy and Energy-dispersive X-ray spectroscopy. Atomic force microscopy will also be utilized to measure the thickness of the nanofilms and to ascertain the topology of the sample surface. Bachelor of Engineering (Electrical and Electronic Engineering) 2019-06-07T02:31:29Z 2019-06-07T02:31:29Z 2019 Final Year Project (FYP) http://hdl.handle.net/10356/77842 en Nanyang Technological University 45 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Electrical and electronic engineering
spellingShingle DRNTU::Engineering::Electrical and electronic engineering
Seah, Jeric Tze Jie
Deposition and characterization of Bismuth nanofilm by sputtering
description Bismuthene, a layer of bismuth atoms, is predicted to be layered semiconductor, while its bulk counterpart is metallic. In this project, fabrication of bismuth thin films under different conditions will be done using the new sputtering system in NTU Nanoelectronics Lab 1 (NEL1) and characterization of the nanofilms will also be done using techniques such as Raman spectroscopy and Energy-dispersive X-ray spectroscopy. Atomic force microscopy will also be utilized to measure the thickness of the nanofilms and to ascertain the topology of the sample surface.
author2 Tay Beng Kang
author_facet Tay Beng Kang
Seah, Jeric Tze Jie
format Final Year Project
author Seah, Jeric Tze Jie
author_sort Seah, Jeric Tze Jie
title Deposition and characterization of Bismuth nanofilm by sputtering
title_short Deposition and characterization of Bismuth nanofilm by sputtering
title_full Deposition and characterization of Bismuth nanofilm by sputtering
title_fullStr Deposition and characterization of Bismuth nanofilm by sputtering
title_full_unstemmed Deposition and characterization of Bismuth nanofilm by sputtering
title_sort deposition and characterization of bismuth nanofilm by sputtering
publishDate 2019
url http://hdl.handle.net/10356/77842
_version_ 1772825877879455744

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