Characteristics of defect modes in side-coupled and mutually coupled microresonator arrays

Characteristics of defect modes in side-coupled and mutually coupled microresonator arrays

We present both theoretically and experimentally the existence of defect modes in side-coupled and mutually coupled microresonator arrays. The qualitative difference between the two types of defect modes is investigated. The Qfactor of both defect modes for varying defect sizes is characterized, and...

Full description

Saved in:
Bibliographic Details
Main Authors: Tobing, Landobasa Yosef Mario A. L., Tjahjana, Liliana, Zhang, Dao Hua
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2013
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Optics, optoelectronics, photonics
Online Access:https://hdl.handle.net/10356/79989
http://hdl.handle.net/10220/17851
Tags: Add Tag
No Tags, Be the first to tag this record!
Institution: Nanyang Technological University
Language: English
Description
Summary:We present both theoretically and experimentally the existence of defect modes in side-coupled and mutually coupled microresonator arrays. The qualitative difference between the two types of defect modes is investigated. The Qfactor of both defect modes for varying defect sizes is characterized, and an enhancement of ∼30×relative to individual loaded resonators is demonstrated. The defect modes are then compared with coupled resonator–induced transparency (CRIT), indicating that the defect modes based on side-coupled microresonator arrays are actually the extension of the CRIT resonance in two-resonator structures.

Similar Items