Mechanism of polarization fatigue in BiFeO3 : the role of Schottky barrier

• Main Authors: Zhou, Yang, Zou, Xi, You, Lu, Guo, Rui, Lim, Zhi Shiuh, Chen, Lang, Yuan, Guoliang, Wang, Junling
• Other Authors: School of Materials Science & Engineering
• Format: Article
• Language: English
• Published: 2014
• Subjects: DRNTU::Engineering::Materials
• Online Access: https://hdl.handle.net/10356/80058; http://hdl.handle.net/10220/18977
• Institution: Nanyang Technological University

By using piezoelectric force microscopy and scanning Kelvin probe microscopy, we have investigated the domain evolution and space charge distribution in planar BiFeO3 capacitors with different electrodes. It is observed that charge injection at the film/electrode interface leads to domain pinning an...