Mechanism of polarization fatigue in BiFeO3 : the role of Schottky barrier

• Main Authors: Zhou, Yang, Zou, Xi, You, Lu, Guo, Rui, Lim, Zhi Shiuh, Chen, Lang, Yuan, Guoliang, Wang, Junling
• 其他作者: School of Materials Science & Engineering
• 格式: Article
• 語言: English
• 出版: 2014
• 主題: DRNTU::Engineering::Materials
• 在線閱讀: https://hdl.handle.net/10356/80058; http://hdl.handle.net/10220/18977

By using piezoelectric force microscopy and scanning Kelvin probe microscopy, we have investigated the domain evolution and space charge distribution in planar BiFeO3 capacitors with different electrodes. It is observed that charge injection at the film/electrode interface leads to domain pinning an...