Active IC metering of digital signal processing subsystem with two-tier activation for secure split test

Active integrated circuit (IC) metering is a class of hardware security protocols that enables the designer to track the number of chips produced from the same mask and remotely activate only the desired ones. This paper reviews existing IC metering approaches to incorporate the advantages of indivi...

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Main Authors: Dhabu, Sumedh Somnath, Zheng, Yue, Liu, Wenye, Chang, Chip Hong
Other Authors: School of Electrical and Electronic Engineering
Format: Conference or Workshop Item
Language:English
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/10356/80470
http://hdl.handle.net/10220/46992
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-804702020-03-07T13:24:44Z Active IC metering of digital signal processing subsystem with two-tier activation for secure split test Dhabu, Sumedh Somnath Zheng, Yue Liu, Wenye Chang, Chip Hong School of Electrical and Electronic Engineering 2018 IEEE International Symposium on Circuits and Systems (ISCAS) Physical Unclonable Functions Two-tier Activation DRNTU::Engineering::Electrical and electronic engineering Active integrated circuit (IC) metering is a class of hardware security protocols that enables the designer to track the number of chips produced from the same mask and remotely activate only the desired ones. This paper reviews existing IC metering approaches to incorporate the advantages of individual methods into a secure functional lock on digital signal processing submodule of wireless communication system to avoid legitimate channel exploitation and the risk of deploying unreliable out-of-specs gray market ICs. Our method makes use of aging-sensitive physical unclonable function to enable a two-tier activation of ICs in split test flow to track chip supply after production tests. Extraneous states are inserted into the state-space mapping of digital signal processing submodule as opposed to controller to provide a stronger state dependency on datapath and input signal. The scheme is illustrated experimentally on a pulse shaping filter of the transmitter for a wireless communication system. MOE (Min. of Education, S’pore) Accepted version 2018-12-17T05:26:50Z 2019-12-06T13:50:15Z 2018-12-17T05:26:50Z 2019-12-06T13:50:15Z 2018 Conference Paper Dhabu, S. S., Zheng, Y., Liu, W., & Chang, C. H. (2018). Active IC metering of digital signal processing subsystem with two-tier activation for secure split test. 2018 IEEE International Symposium on Circuits and Systems (ISCAS). doi:10.1109/ISCAS.2018.8351390 https://hdl.handle.net/10356/80470 http://hdl.handle.net/10220/46992 10.1109/ISCAS.2018.8351390 en © 2018 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: [http://dx.doi.org/10.1109/ISCAS.2018.8351390]. 5 p. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic Physical Unclonable Functions
Two-tier Activation
DRNTU::Engineering::Electrical and electronic engineering
spellingShingle Physical Unclonable Functions
Two-tier Activation
DRNTU::Engineering::Electrical and electronic engineering
Dhabu, Sumedh Somnath
Zheng, Yue
Liu, Wenye
Chang, Chip Hong
Active IC metering of digital signal processing subsystem with two-tier activation for secure split test
description Active integrated circuit (IC) metering is a class of hardware security protocols that enables the designer to track the number of chips produced from the same mask and remotely activate only the desired ones. This paper reviews existing IC metering approaches to incorporate the advantages of individual methods into a secure functional lock on digital signal processing submodule of wireless communication system to avoid legitimate channel exploitation and the risk of deploying unreliable out-of-specs gray market ICs. Our method makes use of aging-sensitive physical unclonable function to enable a two-tier activation of ICs in split test flow to track chip supply after production tests. Extraneous states are inserted into the state-space mapping of digital signal processing submodule as opposed to controller to provide a stronger state dependency on datapath and input signal. The scheme is illustrated experimentally on a pulse shaping filter of the transmitter for a wireless communication system.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Dhabu, Sumedh Somnath
Zheng, Yue
Liu, Wenye
Chang, Chip Hong
format Conference or Workshop Item
author Dhabu, Sumedh Somnath
Zheng, Yue
Liu, Wenye
Chang, Chip Hong
author_sort Dhabu, Sumedh Somnath
title Active IC metering of digital signal processing subsystem with two-tier activation for secure split test
title_short Active IC metering of digital signal processing subsystem with two-tier activation for secure split test
title_full Active IC metering of digital signal processing subsystem with two-tier activation for secure split test
title_fullStr Active IC metering of digital signal processing subsystem with two-tier activation for secure split test
title_full_unstemmed Active IC metering of digital signal processing subsystem with two-tier activation for secure split test
title_sort active ic metering of digital signal processing subsystem with two-tier activation for secure split test
publishDate 2018
url https://hdl.handle.net/10356/80470
http://hdl.handle.net/10220/46992
_version_ 1681049207408951296