Active IC metering of digital signal processing subsystem with two-tier activation for secure split test

• المؤلفون الرئيسيون: Dhabu, Sumedh Somnath, Zheng, Yue, Liu, Wenye, Chang, Chip Hong
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: Conference or Workshop Item
• اللغة: English
• منشور في: 2018
• الموضوعات: Physical Unclonable Functions; Two-tier Activation; DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/80470; http://hdl.handle.net/10220/46992
• المؤسسة: Nanyang Technological University

Active integrated circuit (IC) metering is a class of hardware security protocols that enables the designer to track the number of chips produced from the same mask and remotely activate only the desired ones. This paper reviews existing IC metering approaches to incorporate the advantages of indivi...