Deep transfer metric learning

• Main Authors: Hu, Junlin, Lu, Jiwen, Tan, Yap Peng
• Other Authors: School of Electrical and Electronic Engineering
• Format: Conference or Workshop Item
• Language: English
• Published: 2016
• Subjects: Face; Face recognition; Learning systems; Machine learning; Training; Visualization; Measurement
• Online Access: https://hdl.handle.net/10356/80552; http://hdl.handle.net/10220/40552
• Institution: Nanyang Technological University

Conventional metric learning methods usually assume that the training and test samples are captured in similar scenarios so that their distributions are assumed to be the same. This assumption doesn't hold in many real visual recognition applications, especially when samples are captured across...