Zheng, K., Sun, X. W., Teo, K. L., & Engineering, S. o. E. a. E. (2015). The Effect of Intrinsic Defects on Resistive Switching Based on p–n Heterojunction.
استشهاد بنمط شيكاغوZheng, K., Xiao Wei Sun, K. L. Teo, و School of Electrical and Electronic Engineering. The Effect of Intrinsic Defects On Resistive Switching Based On P–n Heterojunction. 2015.
MLA استشهادZheng, K., Xiao Wei Sun, K. L. Teo, و School of Electrical and Electronic Engineering. The Effect of Intrinsic Defects On Resistive Switching Based On P–n Heterojunction. 2015.
تحذير: قد لا تكون هذه الاستشهادات دائما دقيقة بنسبة 100%.