Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches

Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches

The noise behavior of Au-to-Au microcontact for microelectromechanical system switches has been experimentally studied in the unstable contact region. The results suggest that the electrical conduction remains nonmetallic at the initial stage during contact formation due to the existence of alien fi...

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Main Authors: Qiu, Haodong, Wang, Hong, Ke, Feixiang
Other Authors: School of Electrical and Electronic Engineering
Format: Article
Language:English
Published: 2016
Subjects:
1/f noise
Microelectromechanical systems
Online Access:https://hdl.handle.net/10356/82149
http://hdl.handle.net/10220/41134
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-821492020-09-26T22:18:20Z Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches Qiu, Haodong Wang, Hong Ke, Feixiang School of Electrical and Electronic Engineering Temasek Laboratories 1/f noise Microelectromechanical systems The noise behavior of Au-to-Au microcontact for microelectromechanical system switches has been experimentally studied in the unstable contact region. The results suggest that the electrical conduction remains nonmetallic at the initial stage during contact formation due to the existence of alien films, and traps in the alien layer located at the contact interface could play an important role in determining the conduction noise. The conduction fluctuation induced by electron trapping-detrapping associated with the hydrocarbon layer is found to be an intrinsic noise source contributing to the low frequency noise in the unstable contact region. ASTAR (Agency for Sci., Tech. and Research, S’pore) Published version 2016-08-15T09:12:18Z 2019-12-06T14:47:36Z 2016-08-15T09:12:18Z 2019-12-06T14:47:36Z 2014 Journal Article Qiu, H., Wang, H., & Ke, F. (2014). Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches. Applied Physics Letters, 104(25), 254102-. 0003-6951 https://hdl.handle.net/10356/82149 http://hdl.handle.net/10220/41134 10.1063/1.4886116 en Applied Physics Letters © 2014 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The published version is available at: [http://dx.doi.org/10.1063/1.4886116]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 4 p. application/pdf
institution Nanyang Technological University
building NTU Library
country Singapore
collection DR-NTU
language English
topic 1/f noise
Microelectromechanical systems
spellingShingle 1/f noise
Microelectromechanical systems
Qiu, Haodong
Wang, Hong
Ke, Feixiang
Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches
description The noise behavior of Au-to-Au microcontact for microelectromechanical system switches has been experimentally studied in the unstable contact region. The results suggest that the electrical conduction remains nonmetallic at the initial stage during contact formation due to the existence of alien films, and traps in the alien layer located at the contact interface could play an important role in determining the conduction noise. The conduction fluctuation induced by electron trapping-detrapping associated with the hydrocarbon layer is found to be an intrinsic noise source contributing to the low frequency noise in the unstable contact region.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Qiu, Haodong
Wang, Hong
Ke, Feixiang
format Article
author Qiu, Haodong
Wang, Hong
Ke, Feixiang
author_sort Qiu, Haodong
title Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches
title_short Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches
title_full Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches
title_fullStr Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches
title_full_unstemmed Low frequency noise in the unstable contact region of Au-to-Au microcontact for microelectromechanical system switches
title_sort low frequency noise in the unstable contact region of au-to-au microcontact for microelectromechanical system switches
publishDate 2016
url https://hdl.handle.net/10356/82149
http://hdl.handle.net/10220/41134
_version_ 1681058127770812416

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