Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide
During electrophoretic deposition of graphene oxide (GO) sheets on silicon substrates, not only deposition but also simultaneous anodic oxidation of the silicon substrate takes place, leading to a three-layered material. Scanning electron microscopy images reveal the presence of GO sheets on the sil...
Saved in:
Main Authors: | , , , , , |
---|---|
Other Authors: | |
Format: | Article |
Language: | English |
Published: |
2019
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/83074 http://hdl.handle.net/10220/49744 |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
Institution: | Nanyang Technological University |
Language: | English |
id |
sg-ntu-dr.10356-83074 |
---|---|
record_format |
dspace |
spelling |
sg-ntu-dr.10356-830742023-12-29T06:49:35Z Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide Fritz, Pina A. Lange, Stefanie C. Giesbers, Marcel Zuilhof, Han Boom, Remko M. Schroën, C. G. P. H. School of Chemical and Biomedical Engineering Electrophoretic Deposition Graphene Oxide Engineering::Chemical engineering During electrophoretic deposition of graphene oxide (GO) sheets on silicon substrates, not only deposition but also simultaneous anodic oxidation of the silicon substrate takes place, leading to a three-layered material. Scanning electron microscopy images reveal the presence of GO sheets on the silicon substrate, and this is also confirmed by X-ray photoelectron spectroscopy (XPS), albeit that the carbon portion increases with increasing emission angle, hinting at a thin carbon layer. With increasing applied potential and increasing conductivity of the GO solution, the carbon signal decreases, whereas the overall thickness of the added layer formed on top of the silicon substrate increases. Through XPS spectra in which the Si 2p peaks shifted under those conditions to 103–104 eV, we were able to conclude that significant amounts of oxygen are present, indicative of the formation of an oxide layer. This leads us to conclude that GO can be deposited using electrophoretic deposition, but that at the same time, silicon is oxidized, which may overshadow effects previously assigned to GO deposition. Published version 2019-08-22T04:49:34Z 2019-12-06T15:11:18Z 2019-08-22T04:49:34Z 2019-12-06T15:11:18Z 2019 Journal Article Fritz, P. A., Lange, S. C., Giesbers, M., Zuilhof, H., Boom, R. M., & Schroën, C. G. P. H. (2019). Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide. Langmuir, 35(10), 3717-3723. doi:10.1021/acs.langmuir.8b03139 0743-7463 https://hdl.handle.net/10356/83074 http://hdl.handle.net/10220/49744 10.1021/acs.langmuir.8b03139 en Langmuir © 2019 American Chemical Society. This is an open access article published under a Creative Commons Non-Commercial No Derivative Works (CC-BY-NC-ND) Attribution License, which permits copying and redistribution of the article, and creation of adaptations, all for non-commercial purposes. 7 p. application/pdf |
institution |
Nanyang Technological University |
building |
NTU Library |
continent |
Asia |
country |
Singapore Singapore |
content_provider |
NTU Library |
collection |
DR-NTU |
language |
English |
topic |
Electrophoretic Deposition Graphene Oxide Engineering::Chemical engineering |
spellingShingle |
Electrophoretic Deposition Graphene Oxide Engineering::Chemical engineering Fritz, Pina A. Lange, Stefanie C. Giesbers, Marcel Zuilhof, Han Boom, Remko M. Schroën, C. G. P. H. Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide |
description |
During electrophoretic deposition of graphene oxide (GO) sheets on silicon substrates, not only deposition but also simultaneous anodic oxidation of the silicon substrate takes place, leading to a three-layered material. Scanning electron microscopy images reveal the presence of GO sheets on the silicon substrate, and this is also confirmed by X-ray photoelectron spectroscopy (XPS), albeit that the carbon portion increases with increasing emission angle, hinting at a thin carbon layer. With increasing applied potential and increasing conductivity of the GO solution, the carbon signal decreases, whereas the overall thickness of the added layer formed on top of the silicon substrate increases. Through XPS spectra in which the Si 2p peaks shifted under those conditions to 103–104 eV, we were able to conclude that significant amounts of oxygen are present, indicative of the formation of an oxide layer. This leads us to conclude that GO can be deposited using electrophoretic deposition, but that at the same time, silicon is oxidized, which may overshadow effects previously assigned to GO deposition. |
author2 |
School of Chemical and Biomedical Engineering |
author_facet |
School of Chemical and Biomedical Engineering Fritz, Pina A. Lange, Stefanie C. Giesbers, Marcel Zuilhof, Han Boom, Remko M. Schroën, C. G. P. H. |
format |
Article |
author |
Fritz, Pina A. Lange, Stefanie C. Giesbers, Marcel Zuilhof, Han Boom, Remko M. Schroën, C. G. P. H. |
author_sort |
Fritz, Pina A. |
title |
Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide |
title_short |
Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide |
title_full |
Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide |
title_fullStr |
Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide |
title_full_unstemmed |
Simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide |
title_sort |
simultaneous silicon oxide growth and electrophoretic deposition of graphene oxide |
publishDate |
2019 |
url |
https://hdl.handle.net/10356/83074 http://hdl.handle.net/10220/49744 |
_version_ |
1787136632074272768 |