Nanoscale current spreading analysis in solution-processed graphene oxide/silver nanowire transparent electrodes via conductive atomic force microscopy

• Main Authors: Shaw, Joseph E., Perumal, Ajay, Bradley, Donal D. C., Stavrinou, Paul N., Anthopoulos, Thomas D.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2017
• Subjects: Electrodes; Electrical resistivity
• Online Access: https://hdl.handle.net/10356/83589; http://hdl.handle.net/10220/42694
• Institution: Nanyang Technological University

We use conductive atomic force microscopy (CAFM) to study the origin of long-range conductivity in model transparent conductive electrodes composed of networks of reduced graphene oxide (rGOX) and silver nanowires (AgNWs), with nanoscale spatial resolution. Pristine networks of rGOX (1–3 monolayers-...