Nanoscale current spreading analysis in solution-processed graphene oxide/silver nanowire transparent electrodes via conductive atomic force microscopy

• Main Authors: Shaw, Joseph E., Perumal, Ajay, Bradley, Donal D. C., Stavrinou, Paul N., Anthopoulos, Thomas D.
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2017
• 主題: Electrodes; Electrical resistivity
• 在線閱讀: https://hdl.handle.net/10356/83589; http://hdl.handle.net/10220/42694

We use conductive atomic force microscopy (CAFM) to study the origin of long-range conductivity in model transparent conductive electrodes composed of networks of reduced graphene oxide (rGOX) and silver nanowires (AgNWs), with nanoscale spatial resolution. Pristine networks of rGOX (1–3 monolayers-...