Resolution criteria in double-slit microscopic imaging experiments

• Main Authors: You, Shangting, Kuang, Cuifang, Zhang, Baile
• 其他作者: School of Physical and Mathematical Sciences
• 格式: Article
• 語言: English
• 出版: 2017
• 主題: Imaging and Sensing; Sub-wavelength Optics
• 在線閱讀: https://hdl.handle.net/10356/83884; http://hdl.handle.net/10220/42858
• 機構: Nanyang Technological University

Double-slit imaging is widely used for verifying the resolution of high-resolution and super-resolution microscopies. However, due to the fabrication limits, the slit width is generally non-negligible, which can affect the claimed resolution. In this paper we theoretically calculate the electromagne...