Resolution criteria in double-slit microscopic imaging experiments

• Main Authors: You, Shangting, Kuang, Cuifang, Zhang, Baile
• Other Authors: School of Physical and Mathematical Sciences
• Format: Article
• Language: English
• Published: 2017
• Subjects: Imaging and Sensing; Sub-wavelength Optics
• Online Access: https://hdl.handle.net/10356/83884; http://hdl.handle.net/10220/42858
• Institution: Nanyang Technological University

Double-slit imaging is widely used for verifying the resolution of high-resolution and super-resolution microscopies. However, due to the fabrication limits, the slit width is generally non-negligible, which can affect the claimed resolution. In this paper we theoretically calculate the electromagne...