Resolution criteria in double-slit microscopic imaging experiments

• المؤلفون الرئيسيون: You, Shangting, Kuang, Cuifang, Zhang, Baile
• مؤلفون آخرون: School of Physical and Mathematical Sciences
• التنسيق: مقال
• اللغة: English
• منشور في: 2017
• الموضوعات: Imaging and Sensing; Sub-wavelength Optics
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/83884; http://hdl.handle.net/10220/42858

Double-slit imaging is widely used for verifying the resolution of high-resolution and super-resolution microscopies. However, due to the fabrication limits, the slit width is generally non-negligible, which can affect the claimed resolution. In this paper we theoretically calculate the electromagne...