APA引文

Boo, A. A., Teo, Z. Q., Leong, K. C., Ang, D. S., & Engineering, S. o. E. a. E. (2013). Correlation between oxide trap generation and negative-bias temperature instability.

Chicago Style Citation

Boo, A. A., Z. Q. Teo, K. C. Leong, Diing Shenp Ang, and School of Electrical and Electronic Engineering. Correlation between Oxide Trap Generation and Negative-bias Temperature Instability. 2013.

MLA引文

Boo, A. A., et al. Correlation between Oxide Trap Generation and Negative-bias Temperature Instability. 2013.