Semi-supervised distance metric learning based on local linear regression for data clustering

• Main Authors: Yu, Jun., Wang, Meng., Liu, Yun., Zhang, Hong.
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2013
• Subjects: DRNTU::Engineering::Electrical and electronic engineering
• Online Access: https://hdl.handle.net/10356/85068; http://hdl.handle.net/10220/13661
• Institution: Nanyang Technological University

Distance metric plays an important role in many machine learning tasks. The distance between samples is mostly measured with a predefined metric, ignoring how the samples distribute in the feature space and how the features are correlated. This paper proposes a semi-supervised distance metric learni...