Semi-supervised distance metric learning based on local linear regression for data clustering

• المؤلفون الرئيسيون: Yu, Jun., Wang, Meng., Liu, Yun., Zhang, Hong.
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2013
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/85068; http://hdl.handle.net/10220/13661
• المؤسسة: Nanyang Technological University

Distance metric plays an important role in many machine learning tasks. The distance between samples is mostly measured with a predefined metric, ignoring how the samples distribute in the feature space and how the features are correlated. This paper proposes a semi-supervised distance metric learni...