Palladium-coated and bare copper wire study for ultra-fine pitch wire bonding

There is growing interest in copper (Cu) wire bonding due to its significant cost savings over gold wire. However, concerns on corrosion susceptibility and package reliability have driven the industry to develop alternative materials. Recently, palladium-coated copper (PdCu) wire has become widely u...

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Main Authors: Lim, A. B. Y., Chang, A. C. K., Lee, C. X., Yauw, O., Chylak, B., Chen, Z.
Other Authors: School of Materials Science & Engineering
Format: Article
Language:English
Published: 2013
Online Access:https://hdl.handle.net/10356/85269
http://hdl.handle.net/10220/10206
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-852692023-07-14T15:50:51Z Palladium-coated and bare copper wire study for ultra-fine pitch wire bonding Lim, A. B. Y. Chang, A. C. K. Lee, C. X. Yauw, O. Chylak, B. Chen, Z. School of Materials Science & Engineering There is growing interest in copper (Cu) wire bonding due to its significant cost savings over gold wire. However, concerns on corrosion susceptibility and package reliability have driven the industry to develop alternative materials. Recently, palladium-coated copper (PdCu) wire has become widely used as it is believed to improve reliability. In this paper, we experimented with 0.6 mil PdCu and bare Cu wires. Palladium distribution and grain structure of the PdCu Free Air Ball (FAB) were investigated. It was observed that Electronic Flame Off (EFO) current and the cover gas type have a significant effect on palladium distribution. The Free Air Ball (FAB) hardness was measured and correlated to palladium distribution and grain structure. First bond process responses were characterized. The impact of palladium on wire bondability and wire bond intermetallic using a high temperature storage test was studied. These results for PdCu wire were compared with bare Cu wire. Published version 2013-06-12T01:10:19Z 2019-12-06T16:00:41Z 2013-06-12T01:10:19Z 2019-12-06T16:00:41Z 2013 2013 Journal Article Lim, A. B. Y., Chang, A. C. K., Lee, C. X., Yauw, O., Chylak, B., & Chen, Z. (2013). Palladium-Coated and Bare Copper Wire Study for Ultra-Fine Pitch Wire Bonding. ECS Transactions, 52(1), 717-730. 1938-6737 https://hdl.handle.net/10356/85269 http://hdl.handle.net/10220/10206 10.1149/05201.0717ecst en ECS transactions © 2013 The Electrochemical Society. This paper was published in ECS Transactions and is made available as an electronic reprint (preprint) with permission of The Electrochemical Society. The paper can be found at the following official DOI: [http://dx.doi.org/10.1149/05201.0717ecst].  One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
description There is growing interest in copper (Cu) wire bonding due to its significant cost savings over gold wire. However, concerns on corrosion susceptibility and package reliability have driven the industry to develop alternative materials. Recently, palladium-coated copper (PdCu) wire has become widely used as it is believed to improve reliability. In this paper, we experimented with 0.6 mil PdCu and bare Cu wires. Palladium distribution and grain structure of the PdCu Free Air Ball (FAB) were investigated. It was observed that Electronic Flame Off (EFO) current and the cover gas type have a significant effect on palladium distribution. The Free Air Ball (FAB) hardness was measured and correlated to palladium distribution and grain structure. First bond process responses were characterized. The impact of palladium on wire bondability and wire bond intermetallic using a high temperature storage test was studied. These results for PdCu wire were compared with bare Cu wire.
author2 School of Materials Science & Engineering
author_facet School of Materials Science & Engineering
Lim, A. B. Y.
Chang, A. C. K.
Lee, C. X.
Yauw, O.
Chylak, B.
Chen, Z.
format Article
author Lim, A. B. Y.
Chang, A. C. K.
Lee, C. X.
Yauw, O.
Chylak, B.
Chen, Z.
spellingShingle Lim, A. B. Y.
Chang, A. C. K.
Lee, C. X.
Yauw, O.
Chylak, B.
Chen, Z.
Palladium-coated and bare copper wire study for ultra-fine pitch wire bonding
author_sort Lim, A. B. Y.
title Palladium-coated and bare copper wire study for ultra-fine pitch wire bonding
title_short Palladium-coated and bare copper wire study for ultra-fine pitch wire bonding
title_full Palladium-coated and bare copper wire study for ultra-fine pitch wire bonding
title_fullStr Palladium-coated and bare copper wire study for ultra-fine pitch wire bonding
title_full_unstemmed Palladium-coated and bare copper wire study for ultra-fine pitch wire bonding
title_sort palladium-coated and bare copper wire study for ultra-fine pitch wire bonding
publishDate 2013
url https://hdl.handle.net/10356/85269
http://hdl.handle.net/10220/10206
_version_ 1772826370823421952