Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure

Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure

Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperat...

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Bibliographic Details
Main Authors: Ng, Chee Seng, Baek, Jong Dae, Zade, Vishal, Villegas, Adrian, Lee, Tsung-Han, Su, Pei-Chen, Martini, Ashlie, Lee, Min Hwan
Other Authors: School of Mechanical and Aerospace Engineering
Format: Article
Language:English
Published: 2019
Subjects:
DRNTU::Engineering::Mechanical engineering
Measurement
Electrical
Online Access:https://hdl.handle.net/10356/85348
http://hdl.handle.net/10220/48193
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Institution: Nanyang Technological University
Language: English
Description
Summary:Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperature electrical and electrochemical studies (up to 700°C) in a conventional AFM setup by employing a combination of a micron-scale heater stage (MHS) and custom-made all-metal tips. We present the design, fabrication process and characterization of the MHS and all-metal tips. A temperature dependent impedance measurement on an MHS-integrated half-cell was then successfully demonstrated with a custom-made Pt-Ir tip. Issues and possible room to improve regarding the new approach are also discussed.

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