Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure
Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperat...
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| Main Authors: | , , , , , , , |
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| 其他作者: | |
| 格式: | Article |
| 語言: | English |
| 出版: |
2019
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| 主題: | |
| 在線閱讀: | https://hdl.handle.net/10356/85348 http://hdl.handle.net/10220/48193 |
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| 機構: | Nanyang Technological University |
| 語言: | English |
| 總結: | Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperature electrical and electrochemical studies (up to 700°C) in a conventional AFM setup by employing a combination of a micron-scale heater stage (MHS) and custom-made all-metal tips. We present the design, fabrication process and characterization of the MHS and all-metal tips. A temperature dependent impedance measurement on an MHS-integrated half-cell was then successfully demonstrated with a custom-made Pt-Ir tip. Issues and possible room to improve regarding the new approach are also discussed. |
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