Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure

Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure

Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperat...

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書目詳細資料
Main Authors:	Ng, Chee Seng, Baek, Jong Dae, Zade, Vishal, Villegas, Adrian, Lee, Tsung-Han, Su, Pei-Chen, Martini, Ashlie, Lee, Min Hwan
其他作者:	School of Mechanical and Aerospace Engineering
格式:	Article
語言:	English
出版:	2019
主題:	DRNTU::Engineering::Mechanical engineering Measurement Electrical
在線閱讀:	https://hdl.handle.net/10356/85348 http://hdl.handle.net/10220/48193
標簽:	添加標簽沒有標簽, 成為第一個標記此記錄!

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