Scanning probe-based in situ high temperature electrical and electrochemical measurements in atmospheric pressure

• Main Authors: Ng, Chee Seng, Baek, Jong Dae, Zade, Vishal, Villegas, Adrian, Lee, Tsung-Han, Su, Pei-Chen, Martini, Ashlie, Lee, Min Hwan
• 其他作者: School of Mechanical and Aerospace Engineering
• 格式: Article
• 語言: English
• 出版: 2019
• 主題: DRNTU::Engineering::Mechanical engineering; Measurement; Electrical
• 在線閱讀: https://hdl.handle.net/10356/85348; http://hdl.handle.net/10220/48193

Atomic force microscopy (AFM)-based study of electrical and electrochemical properties of a material/system at an elevated temperature in atmospheric pressure has been limited to ~250°C in conventional AFM setups. In this report, we have demonstrated the viability of a new approach for high temperat...