The Fourth Industrial Revolution : An Orwellian Nightmare ?
Recent development in technology may turn our reality into a dystopian Orwellian nightmare - should we worry about it?
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sg-ntu-dr.10356-875172020-11-01T06:37:21Z The Fourth Industrial Revolution : An Orwellian Nightmare ? Tan, Ming Hui Lemrini, Walid S. Rajaratnam School of International Studies Country and Region Studies Cybersecurity, Biosecurity and Nuclear Safety Recent development in technology may turn our reality into a dystopian Orwellian nightmare - should we worry about it? 2018-02-26T04:40:08Z 2019-12-06T16:43:35Z 2018-02-26T04:40:08Z 2019-12-06T16:43:35Z 2018 Commentary Tan, M. H., & Lemrini, W. (2018). The Fourth Industrial Revolution : An Orwellian Nightmare ? (RSIS Commentaries, No. 029). RSIS Commentaries. Singapore: Nanyang Technological University. https://hdl.handle.net/10356/87517 http://hdl.handle.net/10220/44450 en RSIS Commentaries, 029-18 Nanyang Technological University 4 p. application/pdf |
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Country and Region Studies Cybersecurity, Biosecurity and Nuclear Safety |
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Country and Region Studies Cybersecurity, Biosecurity and Nuclear Safety Tan, Ming Hui Lemrini, Walid The Fourth Industrial Revolution : An Orwellian Nightmare ? |
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Recent development in technology may turn our reality into a dystopian Orwellian nightmare - should we worry about it? |
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S. Rajaratnam School of International Studies |
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S. Rajaratnam School of International Studies Tan, Ming Hui Lemrini, Walid |
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Commentary |
author |
Tan, Ming Hui Lemrini, Walid |
author_sort |
Tan, Ming Hui |
title |
The Fourth Industrial Revolution : An Orwellian Nightmare ? |
title_short |
The Fourth Industrial Revolution : An Orwellian Nightmare ? |
title_full |
The Fourth Industrial Revolution : An Orwellian Nightmare ? |
title_fullStr |
The Fourth Industrial Revolution : An Orwellian Nightmare ? |
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The Fourth Industrial Revolution : An Orwellian Nightmare ? |
title_sort |
fourth industrial revolution : an orwellian nightmare ? |
publishDate |
2018 |
url |
https://hdl.handle.net/10356/87517 http://hdl.handle.net/10220/44450 |
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