Ajaykumar, A., Zhou, X., Chiah, S. B., Syamal, B., & Engineering, S. o. E. a. E. (2018). Impact of Subthreshold Carrier Statistics on the Low-Frequency Noise in MOSFETs.
Chicago Style CitationAjaykumar, Arjun, Xing Zhou, Siau Beh Chiah, Binit Syamal, and School of Electrical and Electronic Engineering. Impact of Subthreshold Carrier Statistics On the Low-Frequency Noise in MOSFETs. 2018.
MLA CitationAjaykumar, Arjun, et al. Impact of Subthreshold Carrier Statistics On the Low-Frequency Noise in MOSFETs. 2018.
Warning: These citations may not always be 100% accurate.