Impact of Subthreshold Carrier Statistics on the Low-Frequency Noise in MOSFETs

• Main Authors: Ajaykumar, Arjun, Zhou, Xing, Chiah, Siau Beh, Syamal, Binit
• Other Authors: School of Electrical and Electronic Engineering
• Format: Article
• Language: English
• Published: 2018
• Subjects: Carrier Number Fluctuation; Hooge Mobility Fluctuation
• Online Access: https://hdl.handle.net/10356/88219; http://hdl.handle.net/10220/44615
• Institution: Nanyang Technological University

Low-frequency noise analysis is being used as a method to understand the nature of carrier transport in new material-based devices and to improve the sensitivity of sensors operating in the subthreshold regime. In this paper, we show that the (gm/Id)2 method used in carrier number fluctuation based...