Impact of Subthreshold Carrier Statistics on the Low-Frequency Noise in MOSFETs

Low-frequency noise analysis is being used as a method to understand the nature of carrier transport in new material-based devices and to improve the sensitivity of sensors operating in the subthreshold regime. In this paper, we show that the (gm/Id)2 method used in carrier number fluctuation based...

وصف كامل

محفوظ في:
التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Ajaykumar, Arjun, Zhou, Xing, Chiah, Siau Beh, Syamal, Binit
مؤلفون آخرون: School of Electrical and Electronic Engineering
التنسيق: مقال
اللغة:English
منشور في: 2018
الموضوعات:
الوصول للمادة أونلاين:https://hdl.handle.net/10356/88219
http://hdl.handle.net/10220/44615
الوسوم: إضافة وسم
لا توجد وسوم, كن أول من يضع وسما على هذه التسجيلة!
المؤسسة: Nanyang Technological University
اللغة: English
الوصف
الملخص:Low-frequency noise analysis is being used as a method to understand the nature of carrier transport in new material-based devices and to improve the sensitivity of sensors operating in the subthreshold regime. In this paper, we show that the (gm/Id)2 method used in carrier number fluctuation based noise formulation needs modification in the subthreshold regime. Based on the new formulation, many published results may require reinterpretation. The new formulation is validated with data extracted from the literature for III-V, nanowire, and high-K gate-stack-based devices.