Majority and minority voted redundancy scheme for safety-critical applications with error/no-error signaling logic

• Main Authors: Balasubramanian, Padmanabhan, Maskell, Douglas, Mastorakis, Nikos
• 其他作者: School of Computer Science and Engineering
• 格式: Article
• 語言: English
• 出版: 2018
• 主題: Fault Tolerance; Redundancy; DRNTU::Engineering::Computer science and engineering
• 在線閱讀: https://hdl.handle.net/10356/88763; http://hdl.handle.net/10220/46974
• 機構: Nanyang Technological University

In the era of nanoelectronics, multiple faults or failures of function blocks are likely to occur. To withstand these, higher levels of redundancy are suggested to be employed in at least the sensitive portions of a circuit or system. In this context, the N-modular redundancy (NMR) scheme may be use...