Defect-induced tunable permittivity of epsilon-near-zero in indium tin oxide thin films
Defect-induced tunable permittivity of Epsilon-Near-Zero (ENZ) in indium tin oxide (ITO) thin films via annealing at different temperatures with mixed gases (98% Ar, 2% O2) was reported. Red-shift of λENZ (Epsilon-Near-Zero wavelength) from 1422 nm to 1995 nm in wavelength was observed. The modulati...
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Main Authors: | Lian, Jiqing, Zhang, Dawei, Hong, Ruijin, Qiu, Peizhen, Lv, Taiguo, Zhang, Daohua |
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其他作者: | School of Electrical and Electronic Engineering |
格式: | Article |
語言: | English |
出版: |
2018
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在線閱讀: | https://hdl.handle.net/10356/88830 http://hdl.handle.net/10220/46977 |
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