Optically reversible electrical soft-breakdown in wide-bandgap oxides — a factorial study

• المؤلفون الرئيسيون: Zhou, Yu, Ang, Diing Shenp, Kalaga, Pranav Sairam
• مؤلفون آخرون: School of Electrical and Electronic Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2019
• الموضوعات: DRNTU::Engineering::Electrical and electronic engineering; Optical Sensing Applications; Wide-bandgap Oxides
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/89085; http://hdl.handle.net/10220/47658

In an earlier work, we found that an electrical soft-breakdown region in wide-bandgap oxides, such as hafnium dioxide, silicon dioxide, etc., could be reversed when illuminated by white light. The effect is evidenced by a decrease in the breakdown leakage current, termed as a negative photoconductiv...