Quantification of biofilm thickness using a swept source based optical coherence tomography system

Optical coherence tomography (OCT) is a non-invasive, non-contact optical measurement and imaging technique that relies on low coherence interferometry. Apart from bio-imaging applications, the applicability of OCT can be extended to metrological investigations because of the inherent capability of...

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Main Authors: Meleppat, Ratheesh Kumar, Murukeshan, Vadakke Matham, Seah, Leong Keey, Shearwood, Christopher
Other Authors: Asundi, Anand K.
Format: Conference or Workshop Item
Language:English
Published: 2018
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Online Access:https://hdl.handle.net/10356/89182
http://hdl.handle.net/10220/47016
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-891822023-03-04T17:07:49Z Quantification of biofilm thickness using a swept source based optical coherence tomography system Meleppat, Ratheesh Kumar Murukeshan, Vadakke Matham Seah, Leong Keey Shearwood, Christopher Asundi, Anand K. Fu, Yu School of Mechanical and Aerospace Engineering Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015) Biological Process Laboratory Centre for Optical and Laser Engineering Optical Frequency Domain Reflectometry Optical Coherence Tomography DRNTU::Engineering::Mechanical engineering Optical coherence tomography (OCT) is a non-invasive, non-contact optical measurement and imaging technique that relies on low coherence interferometry. Apart from bio-imaging applications, the applicability of OCT can be extended to metrological investigations because of the inherent capability of optical interferometry to perform precise measurement with high sensitivity. In this paper, we demonstrate the feasibility of OCT for the measurement of the refractive index and thickness of bacterial biofilm structures grown in a flow cell. In OCT, the depth profiles are constructed by measuring the magnitude and time delay of back reflected light from the scattering sites by means of optical interferometry. The optical distance between scattering points can be obtained by measuring the separation between the point spread functions (PSF) at the respective points in the A-scan data. The refractive index of the biofilm is calculated by measuring the apparent shift in the position of the PSF corresponding to a reference surface, caused by the biofilm growth. In our experiment, the base layer of the flow cell is used as the reference surface. It is observed that the calculated refractive index of the biofilm is close to that of water, and agrees well with the previously reported value. Finally, the physical thickness of the biofilm is calculated by dividing the optical path length by the calculated value of refractive index. MOE (Min. of Education, S’pore) Published version 2018-12-17T08:30:28Z 2019-12-06T17:19:41Z 2018-12-17T08:30:28Z 2019-12-06T17:19:41Z 2015 Conference Paper Meleppat, R. K., Murukeshan, V. M., Seah, L. K., & Shearwood, C. (2015). Quantification of biofilm thickness using a swept source based optical coherence tomography system. Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015), 9524, 95242L-. doi:10.1117/12.2190106 https://hdl.handle.net/10356/89182 http://hdl.handle.net/10220/47016 10.1117/12.2190106 en © 2015 Society of Photo-optical Instrumentation Engineers (SPIE). This paper was published in Proceedings of SPIE - International Conference on Optical and Photonic Engineering (icOPEN2015) and is made available as an electronic reprint (preprint) with permission of Society of Photo-optical Instrumentation Engineers (SPIE). The published version is available at: [http://dx.doi.org/10.1117/12.2190106]. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 6 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic Optical Frequency Domain Reflectometry
Optical Coherence Tomography
DRNTU::Engineering::Mechanical engineering
spellingShingle Optical Frequency Domain Reflectometry
Optical Coherence Tomography
DRNTU::Engineering::Mechanical engineering
Meleppat, Ratheesh Kumar
Murukeshan, Vadakke Matham
Seah, Leong Keey
Shearwood, Christopher
Quantification of biofilm thickness using a swept source based optical coherence tomography system
description Optical coherence tomography (OCT) is a non-invasive, non-contact optical measurement and imaging technique that relies on low coherence interferometry. Apart from bio-imaging applications, the applicability of OCT can be extended to metrological investigations because of the inherent capability of optical interferometry to perform precise measurement with high sensitivity. In this paper, we demonstrate the feasibility of OCT for the measurement of the refractive index and thickness of bacterial biofilm structures grown in a flow cell. In OCT, the depth profiles are constructed by measuring the magnitude and time delay of back reflected light from the scattering sites by means of optical interferometry. The optical distance between scattering points can be obtained by measuring the separation between the point spread functions (PSF) at the respective points in the A-scan data. The refractive index of the biofilm is calculated by measuring the apparent shift in the position of the PSF corresponding to a reference surface, caused by the biofilm growth. In our experiment, the base layer of the flow cell is used as the reference surface. It is observed that the calculated refractive index of the biofilm is close to that of water, and agrees well with the previously reported value. Finally, the physical thickness of the biofilm is calculated by dividing the optical path length by the calculated value of refractive index.
author2 Asundi, Anand K.
author_facet Asundi, Anand K.
Meleppat, Ratheesh Kumar
Murukeshan, Vadakke Matham
Seah, Leong Keey
Shearwood, Christopher
format Conference or Workshop Item
author Meleppat, Ratheesh Kumar
Murukeshan, Vadakke Matham
Seah, Leong Keey
Shearwood, Christopher
author_sort Meleppat, Ratheesh Kumar
title Quantification of biofilm thickness using a swept source based optical coherence tomography system
title_short Quantification of biofilm thickness using a swept source based optical coherence tomography system
title_full Quantification of biofilm thickness using a swept source based optical coherence tomography system
title_fullStr Quantification of biofilm thickness using a swept source based optical coherence tomography system
title_full_unstemmed Quantification of biofilm thickness using a swept source based optical coherence tomography system
title_sort quantification of biofilm thickness using a swept source based optical coherence tomography system
publishDate 2018
url https://hdl.handle.net/10356/89182
http://hdl.handle.net/10220/47016
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