Multifunctional hydrogel nano-probes for atomic force microscopy

Since the invention of the atomic force microscope (AFM) three decades ago, there have been numerous advances in its measurement capabilities. Curiously, throughout these developments, the fundamental nature of the force-sensing probe—the key actuating element—has remained largely unchanged. It is p...

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Main Authors: Lee, Jae Seol, Song, Jungki, Kim, Seong Oh, Kim, Seokbeom, Lee, Wooju, Jackman, Joshua A., Kim, Dongchoul, Cho, Nam-Joon, Lee, Jungchul
Other Authors: School of Chemical and Biomedical Engineering
Format: Article
Language:English
Published: 2018
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Online Access:https://hdl.handle.net/10356/89944
http://hdl.handle.net/10220/47169
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Institution: Nanyang Technological University
Language: English
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spelling sg-ntu-dr.10356-899442023-07-14T15:46:24Z Multifunctional hydrogel nano-probes for atomic force microscopy Lee, Jae Seol Song, Jungki Kim, Seong Oh Kim, Seokbeom Lee, Wooju Jackman, Joshua A. Kim, Dongchoul Cho, Nam-Joon Lee, Jungchul School of Chemical and Biomedical Engineering School of Materials Science & Engineering Centre for Biomimetic Sensor Science DRNTU::Engineering::Materials Atomic Force Microscopy Gels And Hydrogels Since the invention of the atomic force microscope (AFM) three decades ago, there have been numerous advances in its measurement capabilities. Curiously, throughout these developments, the fundamental nature of the force-sensing probe—the key actuating element—has remained largely unchanged. It is produced by long-established microfabrication etching strategies and typically composed of silicon-based materials. Here, we report a new class of photopolymerizable hydrogel nano-probes that are produced by bottom-up fabrication with compressible replica moulding. The hydrogel probes demonstrate excellent capabilities for AFM imaging and force measurement applications while enabling programmable, multifunctional capabilities based on compositionally adjustable mechanical properties and facile encapsulation of various nanomaterials. Taken together, the simple, fast and affordable manufacturing route and multifunctional capabilities of hydrogel AFM nano-probes highlight the potential of soft matter mechanical transducers in nanotechnology applications. The fabrication scheme can also be readily utilized to prepare hydrogel cantilevers, including in parallel arrays, for nanomechanical sensor devices. NRF (Natl Research Foundation, S’pore) NMRC (Natl Medical Research Council, S’pore) Published version 2018-12-21T04:35:15Z 2019-12-06T17:37:09Z 2018-12-21T04:35:15Z 2019-12-06T17:37:09Z 2016 Journal Article Lee, J. S., Song, J., Kim, S. O., Kim, S., Lee, W., Jackman, J. A., . . . Lee, J. (2016). Multifunctional hydrogel nano-probes for atomic force microscopy. Nature Communications, 7, 11566-. doi:10.1038/ncomms11566 https://hdl.handle.net/10356/89944 http://hdl.handle.net/10220/47169 10.1038/ncomms11566 27199165 en Nature Communications © 2016 The Author(s) (Published by Nature Publishing Group). This work is licensed under a Creative Commons Attribution 4.0 International License. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. 14 p. application/pdf
institution Nanyang Technological University
building NTU Library
continent Asia
country Singapore
Singapore
content_provider NTU Library
collection DR-NTU
language English
topic DRNTU::Engineering::Materials
Atomic Force Microscopy
Gels And Hydrogels
spellingShingle DRNTU::Engineering::Materials
Atomic Force Microscopy
Gels And Hydrogels
Lee, Jae Seol
Song, Jungki
Kim, Seong Oh
Kim, Seokbeom
Lee, Wooju
Jackman, Joshua A.
Kim, Dongchoul
Cho, Nam-Joon
Lee, Jungchul
Multifunctional hydrogel nano-probes for atomic force microscopy
description Since the invention of the atomic force microscope (AFM) three decades ago, there have been numerous advances in its measurement capabilities. Curiously, throughout these developments, the fundamental nature of the force-sensing probe—the key actuating element—has remained largely unchanged. It is produced by long-established microfabrication etching strategies and typically composed of silicon-based materials. Here, we report a new class of photopolymerizable hydrogel nano-probes that are produced by bottom-up fabrication with compressible replica moulding. The hydrogel probes demonstrate excellent capabilities for AFM imaging and force measurement applications while enabling programmable, multifunctional capabilities based on compositionally adjustable mechanical properties and facile encapsulation of various nanomaterials. Taken together, the simple, fast and affordable manufacturing route and multifunctional capabilities of hydrogel AFM nano-probes highlight the potential of soft matter mechanical transducers in nanotechnology applications. The fabrication scheme can also be readily utilized to prepare hydrogel cantilevers, including in parallel arrays, for nanomechanical sensor devices.
author2 School of Chemical and Biomedical Engineering
author_facet School of Chemical and Biomedical Engineering
Lee, Jae Seol
Song, Jungki
Kim, Seong Oh
Kim, Seokbeom
Lee, Wooju
Jackman, Joshua A.
Kim, Dongchoul
Cho, Nam-Joon
Lee, Jungchul
format Article
author Lee, Jae Seol
Song, Jungki
Kim, Seong Oh
Kim, Seokbeom
Lee, Wooju
Jackman, Joshua A.
Kim, Dongchoul
Cho, Nam-Joon
Lee, Jungchul
author_sort Lee, Jae Seol
title Multifunctional hydrogel nano-probes for atomic force microscopy
title_short Multifunctional hydrogel nano-probes for atomic force microscopy
title_full Multifunctional hydrogel nano-probes for atomic force microscopy
title_fullStr Multifunctional hydrogel nano-probes for atomic force microscopy
title_full_unstemmed Multifunctional hydrogel nano-probes for atomic force microscopy
title_sort multifunctional hydrogel nano-probes for atomic force microscopy
publishDate 2018
url https://hdl.handle.net/10356/89944
http://hdl.handle.net/10220/47169
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