Optimal multi-objective burn-in policy based on time-transformed Wiener degradation process

• Main Authors: Lyu, Yi, Zhang, Yun, Chen, Kairui, Chen, Ci, Zeng, Xianxian
• 其他作者: School of Electrical and Electronic Engineering
• 格式: Article
• 語言: English
• 出版: 2019
• 主題: Degradation; Wiener Process; Engineering::Electrical and electronic engineering
• 在線閱讀: https://hdl.handle.net/10356/90045; http://hdl.handle.net/10220/49347

Burn-in is an effective and widely used means to improve product reliability by eliminating weak units before they are distributed in the market. Traditional burn-in that distinguishes weak units by failure during testing is inefficient and incompetent for degradation-failed products in which weak u...