Nanoscale polarization relaxation of epitaxial BiFeO3 thin film

• المؤلفون الرئيسيون: Chen, Weigang, You, Lu, Chen, Gaofeng, Chua, Ngeah Theng, Guan, Ong Hock, Zou, Xi, Wang, Junling, Chen, Lang
• مؤلفون آخرون: School of Materials Science & Engineering
• التنسيق: مقال
• اللغة: English
• منشور في: 2011
• الموضوعات: DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
• الوصول للمادة أونلاين: https://hdl.handle.net/10356/90597; http://hdl.handle.net/10220/7400

The polarization relaxation phenomena in a 40-nm-thick epitaxial BiFeO3 thin film grown on a (001) SrTiO3 substrate with SrRuO3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The as-grown film shows highly irregular mosaic domain pa...