In-circuit impedance measurement based on a two-probe approach

Most impedance measurement instruments usually measure the impedance of a component or device under no-load condition. Therefore, any non-linear behaviour and other on board circuit components or parasitic are not detected or taken into consideration. Based on a novel two-probe measurement technique...

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Main Authors:	Chang, Richard Weng Yew, See, Kye Yak, Bo, Hu
Other Authors:	School of Electrical and Electronic Engineering
Format:	Conference or Workshop Item
Language:	English
Published:	2010
Subjects:	DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
Online Access:	https://hdl.handle.net/10356/91030 http://hdl.handle.net/10220/6370
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Institution:	Nanyang Technological University
Language:	English

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spelling	sg-ntu-dr.10356-910302020-03-07T13:24:46Z In-circuit impedance measurement based on a two-probe approach Chang, Richard Weng Yew See, Kye Yak Bo, Hu School of Electrical and Electronic Engineering Electrical Design of Advanced Packaging and Systems Symposium (2008 : Seoul, South Korea) Guided Systems Division, DSO National Laboratories DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials Most impedance measurement instruments usually measure the impedance of a component or device under no-load condition. Therefore, any non-linear behaviour and other on board circuit components or parasitic are not detected or taken into consideration. Based on a novel two-probe measurement technique, the impedance of any in-circuit component can be measured with ease. Using the resistor characterization as a preliminary study, the proposed technique is able to accurately determine the impedance of the in-circuit resistor at the intended operating condition up to 1 GHz. Published version 2010-08-30T09:03:36Z 2019-12-06T17:58:28Z 2010-08-30T09:03:36Z 2019-12-06T17:58:28Z 2008 2008 Conference Paper Chang, R. W. Y., See, K. Y, & Bo, H. (2008). In-circuit impedance measurement based on a two-probe approach. In proceedings of the Electrical Design of Advanced Packaging and Systems Symposium: Seoul, South Korea, (pp.35-38). https://hdl.handle.net/10356/91030 http://hdl.handle.net/10220/6370 10.1109/EDAPS.2008.4735992 en © 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. http://www.ieee.org/portal/site This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. 4 p. application/pdf
institution	Nanyang Technological University
building	NTU Library
country	Singapore
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials
spellingShingle	DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials Chang, Richard Weng Yew See, Kye Yak Bo, Hu In-circuit impedance measurement based on a two-probe approach
description	Most impedance measurement instruments usually measure the impedance of a component or device under no-load condition. Therefore, any non-linear behaviour and other on board circuit components or parasitic are not detected or taken into consideration. Based on a novel two-probe measurement technique, the impedance of any in-circuit component can be measured with ease. Using the resistor characterization as a preliminary study, the proposed technique is able to accurately determine the impedance of the in-circuit resistor at the intended operating condition up to 1 GHz.
author2	School of Electrical and Electronic Engineering
author_facet	School of Electrical and Electronic Engineering Chang, Richard Weng Yew See, Kye Yak Bo, Hu
format	Conference or Workshop Item
author	Chang, Richard Weng Yew See, Kye Yak Bo, Hu
author_sort	Chang, Richard Weng Yew
title	In-circuit impedance measurement based on a two-probe approach
title_short	In-circuit impedance measurement based on a two-probe approach
title_full	In-circuit impedance measurement based on a two-probe approach
title_fullStr	In-circuit impedance measurement based on a two-probe approach
title_full_unstemmed	In-circuit impedance measurement based on a two-probe approach
title_sort	in-circuit impedance measurement based on a two-probe approach
publishDate	2010
url	https://hdl.handle.net/10356/91030 http://hdl.handle.net/10220/6370
_version_	1681047358217912320

In-circuit impedance measurement based on a two-probe approach

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