Analysis of nonideal effects on a tomography-based switched-capacitor transducer

This paper presents a nonideal analysis of a fully-integrated switched-capacitor capacitive transducer for electrical capacitance tomography system. The investigation establishes different types of error source models as well as practical mismatch effects in the derivation of second-order analytical...

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Main Authors: Jia, Peng, Chan, Pak Kwong
其他作者: School of Electrical and Electronic Engineering
格式: Article
語言:English
出版: 2009
在線閱讀:https://hdl.handle.net/10356/91211
http://hdl.handle.net/10220/4682
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機構: Nanyang Technological University
語言: English