Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films

A “misfit strain-temperature” phase diagram for BiFeO3 thin film was constructed based on the Landau–Devonshire theory with the mechanical substrate effect. It is found that the polarization instabilities result in the formation of the mo...

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Main Authors:	Wang, Junling, Ma, Jan, Boey, Freddy Yin Chiang, Ma, Hua, Chen, Lang
Other Authors:	School of Materials Science & Engineering
Format:	Article
Language:	English
Published:	2011
Subjects:	DRNTU::Engineering::Materials::Magnetic materials DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
Online Access:	https://hdl.handle.net/10356/91520 http://hdl.handle.net/10220/6927
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Institution:	Nanyang Technological University
Language:	English

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spelling	sg-ntu-dr.10356-915202023-07-14T15:53:08Z Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films Wang, Junling Ma, Jan Boey, Freddy Yin Chiang Ma, Hua Chen, Lang School of Materials Science & Engineering DRNTU::Engineering::Materials::Magnetic materials DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films A “misfit strain-temperature” phase diagram for BiFeO3 thin film was constructed based on the Landau–Devonshire theory with the mechanical substrate effect. It is found that the polarization instabilities result in the formation of the monoclinic phases in BiFeO3 thin films. The effective substrate lattice parameter has been introduced to calculate the film thickness dependence of the polarization and the dielectric constants. The theoretical results are in agreement with the experimental data for the thickness dependence of ferroelectric properties of the BiFeO3 epitaxial thin films on SrTiO3 and Si substrates. Published version 2011-07-19T06:38:06Z 2019-12-06T18:07:10Z 2011-07-19T06:38:06Z 2019-12-06T18:07:10Z 2008 2008 Journal Article Ma, H., Chen, L., Wang, J., Ma, J., & Boey, F. (2008). Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films. Applied Physics Letters, 92. https://hdl.handle.net/10356/91520 http://hdl.handle.net/10220/6927 10.1063/1.2920192 en Applied physics letters © 2008 American Institute of Physics. This paper was published in Applied Physics Letters and is made available as an electronic reprint (preprint) with permission of American Institute of Physics. The paper can be found at the following DOI: http://dx.doi.org/10.1063/1.2920192. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper is prohibited and is subject to penalties under law. 3 p. application/pdf
institution	Nanyang Technological University
building	NTU Library
continent	Asia
country	Singapore Singapore
content_provider	NTU Library
collection	DR-NTU
language	English
topic	DRNTU::Engineering::Materials::Magnetic materials DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films
spellingShingle	DRNTU::Engineering::Materials::Magnetic materials DRNTU::Engineering::Materials::Microelectronics and semiconductor materials::Thin films Wang, Junling Ma, Jan Boey, Freddy Yin Chiang Ma, Hua Chen, Lang Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films
description	A “misfit strain-temperature” phase diagram for BiFeO3 thin film was constructed based on the Landau–Devonshire theory with the mechanical substrate effect. It is found that the polarization instabilities result in the formation of the monoclinic phases in BiFeO3 thin films. The effective substrate lattice parameter has been introduced to calculate the film thickness dependence of the polarization and the dielectric constants. The theoretical results are in agreement with the experimental data for the thickness dependence of ferroelectric properties of the BiFeO3 epitaxial thin films on SrTiO3 and Si substrates.
author2	School of Materials Science & Engineering
author_facet	School of Materials Science & Engineering Wang, Junling Ma, Jan Boey, Freddy Yin Chiang Ma, Hua Chen, Lang
format	Article
author	Wang, Junling Ma, Jan Boey, Freddy Yin Chiang Ma, Hua Chen, Lang
author_sort	Wang, Junling
title	Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films
title_short	Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films
title_full	Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films
title_fullStr	Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films
title_full_unstemmed	Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films
title_sort	strain effects and thickness dependence of ferroelectric properties in epitaxial bifeo3 thin films
publishDate	2011
url	https://hdl.handle.net/10356/91520 http://hdl.handle.net/10220/6927
_version_	1772826272988135424

Strain effects and thickness dependence of ferroelectric properties in epitaxial BiFeO3 thin films

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